Dr. Yoichi Miyahara
Texas State University, USA

Thursday, March 26
15:15
Abstract
Scanning Single-Electron Box Probe for Charge/Potential Sensing with Nanometer Spatial Resolution for Quantum Device Applications
Probing charge and electric potential with high sensitivity at the nanometer scale is essential for quantum devices, where dopants, defects, and fluctuating charges cause decoherence in qubits. We introduce Scanning Single-Electron Box electrometry, which integrates a single-electron box with atomic force microscopy (AFM) for ultrasensitive, nanometer-resolved detection. A single electron tunnels between a metallic island at the probe apex and the tip body during oscillation, with the sample acting as a gate. This tunneling, read out via changes in damping and resonance, offers a sensitivity comparable to single-electron transistor with far simpler, low-cost probe fabrication compatible with standard AFMs.
Biography
Dr. Yoichi Miyahara is an associate professor of physics at Texas State University, specializing in advanced scanning probe microscopy for quantum materials and devices. He earned his Ph.D. in electrical engineering from Waseda University and held research positions at McGill University and EPFL before joining Texas State in 2019. His lab develops novel force-detected spectroscopic techniques to study quantum dots, nanoparticles, and 2D materials with nanometer-scale resolution. A recipient of NSF CAREER and MRI awards, he leads instrumentation efforts for ultra-low-temperature quantum measurements.